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Influence of Thickness and Annealing Temperature on the Electrical, Optical and Structural Propertie
【机 构】
：
Department of physics, Soochow University, Soochow 215006, China;The Key Laboratory of Thin Films of
【出 处】
：
The 17th International Conference on Surface Modification of
【发表日期】
：
2011年3期
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