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描述了相干检测偏振共焦扫描显微成像技术的原理、方法和实验结果 ,给出了成像条件 ,并用这种技术分析测试了掺杂半导体纳米材料 Cu Cl和 Ti O2 聚乙烯薄膜的局域双折射性质和偏振特性。
The principle, method and experimental results of the coherent detection polarization confocal scanning microscopy are described. The imaging conditions are given. The technique of the technique is used to analyze and test the local doping of the semiconductor nanocomposite Cu Cl and Ti O2 polyethylene films Refractive properties and polarization characteristics.