运用电子探针显微分析(EPMA)技术,能有效地研究快离子导体中的金属沉积问题。电子探针是一束聚焦很细的电子束,用以轰击试样,由于探针的电子注入到试样表面,形成负电位,使得快离子试样中的阳离子在电场作用下向电子束注入轰击点迁移、集中,与电子中和后转变为金属原子。当这些析出的原子在传输过程中受到阻碍时,可能在材料表面积累或 The use of electron probe microanalysis (EPMA) technology can effectively study the fast ion conductor metal deposition problems. Electron probe is a bunch of very fine electron beam for bombardment of the sample. Since the probe’s electrons are injected onto the surface of the sample to form a negative potential, the ions in the fast ion sample are injected into the electron beam under the action of an electric field Bombardment point migration, concentration, and after the electronic conversion into metal atoms. When these precipitated atoms are hindered during transport, they may accumulate on the surface of the material or