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采用Sol Gel法制备了P2 O5 SiO2 快质子导电玻璃 ,用四探针薄层电阻测试仪、XRD、IR等手段对玻璃的电性能、物相结构和组成进行了表征 ,并探讨了质子导电机理。结果表明P2 O5 SiO2 快质子导电玻璃中的强氢键、分子水、结构的不完整性是导致高质子导电率的主要原因。
The P2 O5 SiO2 fast proton conductive glass was prepared by Sol Gel method. The electrical properties, phase structure and composition of the glass were characterized by four-probe thin-film resistance tester, XRD and IR. The proton conduction mechanism . The results show that the strong hydrogen bond, molecular water and structural imperfections in P2 O5 SiO2 fast proton conductive glass are the main reasons leading to high proton conductivity.