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扫描隧道显微镜(STM)是近几年发展起来的一种用于物质表面研究的新仪器。它利用量子隧道效应的原理,将原子线度的极细针尖在接近样品处(<10)扫描,通过监测样品与钎尖间隧道电流随距离的变化,得到样品表面的形貌。 图1为中国科学院化学研究所于1988年4月研制成功的一台由微机控制的STM。据测得的数据表明,该仪器垂直于表面方向的分辨串为0.1,横向分辨率为1。仪器性能指标达到目前国际上实验室研制仪器的
Scanning tunneling microscope (STM) is a new instrument developed in recent years for material surface research. It uses the principle of quantum tunneling to scan the very fine needlepoint of the atomic degree near the sample (<10), and the surface morphology of the sample is obtained by monitoring the tunneling current with the distance between the sample and the tip. Figure 1 is a microcomputer-controlled STM that was successfully developed by Institute of Chemistry, Chinese Academy of Sciences in April 1988. According to the measured data show that the instrument perpendicular to the surface of the resolution string is 0.1, the horizontal resolution of 1. Instrument performance indicators to achieve the current international laboratory equipment