论文部分内容阅读
本文评述了Hg_(1-x)Cd_xTe的不稳定性,对比分析了含电子元素Zn或磁性元素Fe、Mn的三元化合物以及超晶格结构Hg_(1-x)Cd_xTe的稳定性,并报道了用X衍射、俄歇电子谱(AES)及光电子能谱(XPS)分析MCT表面层阳极氧化状态,考查了清洗条件影响和Hg-O关联的一些实验结果。比较研究的结果表明,在发展新材料方面,以(HgZn)Te近期应用的优势最大。与此同时,在MCT生长条件和表面状态的进一步研究方面,以改善材料稳定性和器件光电特性为主的课题仍具有相当潜力。
In this paper, the instability of Hg_ (1-x) Cd_xTe is reviewed. The stability of the ternary compound containing Zn or Fe, Mn and the super lattice structure Hg_ (1-x) Cd_xTe are reported. XRD, Auger electron spectroscopy (AES) and photoelectron spectroscopy (XPS) were used to analyze the anodic oxidation state of the surface layer of MCT. Some experimental results about the relationship between cleaning conditions and Hg-O were also investigated. The results of comparative studies show that the most recent application of (HgZn) Te has the greatest advantage in the development of new materials. At the same time, there are considerable potential for further research on MCT growth conditions and surface conditions in order to improve material stability and device optoelectronic properties.