介绍了用能量色散X射线荧光光谱(EDXRF)法测定U-Ta合金中Ta含量的分析方法。该方法将样品溶解,加载于滤纸片上,制成滤纸试样片,用X射线荧光光谱仪测定试样片中Ta含量。该方法简便、快速、准确,适用于Ta含量在1%～6%范围的U-Ta合金样品的Ta含量测定。对Ta含量为1.5%的样品,测量结果的相对标准偏差(n=6)不大于0.6%;Ta含量为5%的样品,测量结果的相对标准偏差(n=6)不大于0.3%。 The method for the determination of Ta in U-Ta alloy by energy dispersive X-ray fluorescence spectrometry (EDXRF) is introduced. In this method, the sample is dissolved, loaded on a filter paper to make a filter paper sample, and the content of Ta in the sample is measured by an X-ray fluorescence spectrometer. The method is simple, rapid and accurate and is suitable for the determination of the content of Ta in U-Ta alloy with the content of Ta in the range of 1% ~ 6%. The relative standard deviation (n = 6) of samples with Ta content of 1.5% was not more than 0.6%. The relative standard deviation (n = 6) of samples with Ta content of 5% was not more than 0.3%.