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给出了 Ｅ Ｅ Ｐ Ｒ Ｏ Ｍ 器件的中子辐照实验结果，发现 ２８ Ｃ６４ 和 ２８ Ｃ２５６ 的 １４ Ｍ ｅ Ｖ 中子辐照效应不是以往所认为的单粒子效应，而是总剂量效应。器件出现的错误不是随机的，而是存在中子注量阈值；不同的错误有不同的阈值。在相同的中子注量下，加电的器件出现错误，而不加电的器件无错误；对于 ２８ Ｃ２５６，“０”→“１”错误比“１”→“０”错误容易发生；存贮单元由一种状态彻底变为相反状态之前的一段时间内，其状态是不确定的；停止辐照后，中子注量不再增加时，错误数仍在增加，说明是控制部件出错导致的。
The experimental results of neutron irradiation in E P R O M devices are given. It is found that the 14 M e V neutron irradiation effects of 28 C64 and 28 C256 are not single particle effects, but total dose effects. The device error is not random, but there is a neutron fluence threshold; different errors have different thresholds. With the same neutron fluence, a powered device has an error, while a non-powered device has no errors; errors of “0” → “1” are easier to occur than “1” → “0” for 28 C256; Storage unit from a state completely changed to the opposite state before a period of time, its state is uncertain; stop irradiation, the neutron fluence no longer increases, the number of errors is still increasing, indicating that the control part of the error caused of.