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光电成像系统由于欠抽样引起频谱混淆， 推导分析了包括均匀微扫描在内的非均匀微扫描方法在减少混淆方面的数学原理以及与亚像素位移之间的关系， 同时用计算机模拟实现了微扫描的一维和二维过程。
The optoelectronic imaging system causes spectrum confusion due to under-sampling. The mathematical principle of non-uniform micro-scanning including uniform micro-scanning in reducing aliasing and the relationship with sub-pixel displacement are deduced and analyzed. The micro-scanning One-dimensional and two-dimensional processes.