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使用傅里叶变换光谱仪(FTIR)测试甚长波宽波段(6.4~15μm)红外探测器响应光谱的过程中,发现短波方向响应光谱异常。通过分步测试分析发现:探测器和放大器工作在非线性工作区导致某些情况下仪器信号发生饱和,引起了短波方向响应光谱畸变的现象。对FTIR测量甚长波宽波段(6.4~15μm)红外探测器响应光谱的畸变现象进行了分析,认为探测器的响应时间是影响其响应光谱的重要因素,并通过试验确定了测试系统对不同探测器所设置的测试参数,消除了响应光谱畸变的现象,并提高了测试准确度。
FTIR spectroscopy was used to test the spectral responses of very long-wave and wide-band (6.4 ~ 15μm) infrared detectors and found that the shortwave response spectrum was abnormal. Through the step-by-step test and analysis, it is found that the detector and amplifier work in the non-linear work area, which leads to the saturation of the instrument signal in some cases and causes the phenomenon that the short-wavelength response spectrum is distorted. The distortion of the response spectrum of the FTIR infrared spectrometer was analyzed. The response time of the FTIR was considered as an important factor influencing the response spectrum of the FTIR spectrometer, and the effect of the test system on different detectors Set the test parameters, eliminating the phenomenon of response to spectral distortion, and improve the test accuracy.