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由于集成电路集成度的不断提高,CPU功能也不断增强。通过有限的外引线检测和诊断CPU的功能乃是各集成电路厂家共同关心的问题。目前常用的测试方法有:试验法,样品比较法和存贮器响应法(包括逻辑模拟、程序仿真与样品学习法),不管哪一种测试方法,都存在一个测试图案优化问题,即用最少的测试图案,有效而迅速地检查和诊断CPU的功
Due to the continuous improvement of integrated circuit integration, CPU functions are also continuously enhanced. Detecting and diagnosing the function of the CPU through a limited number of external leads is a common concern among IC manufacturers. Currently used test methods are: test method, sample comparison method and memory response method (including logic simulation, program simulation and sample learning), regardless of which test method, there is a test pattern optimization problem, that is, with the least The test pattern, effective and rapid inspection and diagnosis of CPU work