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本文提出基于特征分析法的ROM加权及RAM两次求反加权故障诊断算法。该算法可植入被测系统控制软件之中，完成ROM及RAM的实时故障自诊断。
In this paper, a method of ROM weighting and RAM twice-weighted inverse fault diagnosis based on eigenanalysis is proposed. The algorithm can be embedded in the system under test control software to complete the ROM and RAM real-time fault self-diagnosis.