一、前言电子钟表集成电路是一种CMOS低电压中大规模集成电路,芯片内含有数百至数千个MOS场效应晶体管,它是电子钟表的心脏。为了保证电子钟表走时准确性和使用寿命,必须对钟表电路各项技术参数进行一系列严格的测试,诸如电流、电压、频率、输出阻抗、脉宽、功能、笔划、符号等十多个参数的测试。但是,以往国内所使用的常规测试仪器,无论在精度和功能方面,都存在一定的问题。有必 I. INTRODUCTION Electronic clock and watch integrated circuit is a CMOS low voltage large scale integrated circuit, the chip contains hundreds to thousands of MOS field effect transistors, which is the heart of electronic watches. In order to ensure the accuracy and service life of electronic clocks, we must carry out a series of rigorous tests on the technical parameters of the clock circuit, such as current, voltage, frequency, output impedance, pulse width, function, stroke, symbol test. However, the conventional test instruments used in the past have certain problems in terms of accuracy and function. It is necessary