数千电子伏特(Multi-keV)量级的X射线背光成像是高能密度等离子体物理实验中常用的一种诊断技术。在神光II激光装置上,研究了纳秒激光驱动钛4.7keV波段及氯2.7keV波段背光面源的性能。研究结果表明,氯背光能谱以类He线及类H线为主,其中2.7keV波段的类He-α线最强;在当前神光II激光加载能力下,氯背光面源相对强度超过钛背光面源一个量级,因此,可选用氯He-α线的X光探针进行背光诊断。 Multi-keV X-ray backlit imaging is a commonly used diagnostic technique in high-energy density plasma physics experiments. In Shen Guang II laser device, the nanosecond laser-driven titanium 4.7keV band and chlorine 2.7keV band backlight surface performance. The results show that the energy spectrum of chlorine back light is mainly He-like and H-like, of which the He-α-like line at 2.7 keV is the strongest. Under the current SG-II laser loading capability, the relative intensity of chlorine- The backlight source is one order of magnitude, so the X-ray probe with chlorine He-alpha line can be used for backlight diagnosis.