主要介绍一种A/D转换芯片静态参数测试电路,该测试电路的设计基于A/D静态参数测试的直方图法,同时PC机上运行的Labview测试程序控制PC机并口通过EPP协议与该测试电路通讯,获得测试数据,完成参数运算。 This paper mainly introduces a static parameter test circuit of A / D converter chip. The design of the test circuit is based on the histogram of A / D static parameter test. At the same time, the Labview test program running on the PC controls the parallel port of the PC through the EPP protocol and the test circuit Communication, access to test data, complete the parameter operation.