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采用高频小火花光源,将下电极改装为运动方式,直接测定了X光天文成像望远镜前置滤光片上铝镁合金镀膜层中镁的含量。通过实验确定了分析条件,建立了分析方法。用两台进口的大型ICP光源直读发射光谱仪器对实验结果进行了对照,求得修正系数K为0.7,K的数值反映着系统误差的大小。修正后的结果最大相对标准偏差为16.8％,最小1.7％。讨论了系统误差的来源和实验过程中的有关现象。本方法简便易行,技术、操作均容易掌握,不需昂贵费用,一般实验室都能实现。在不具备大型薄层分析仪器和受种种条件限制的地方,采用此法能一定程度地解决薄层分析任务,具有现实意义。
Using high-frequency small spark light source, the lower electrode converted to a movement mode, direct determination of the X-ray astronomical telescope pre-filter aluminum-magnesium alloy coating layer of magnesium content. Through the experiment, the analysis conditions were established and the analytical method was established. Two imported large-scale ICP direct-reading emission spectrometers were used to compare the experimental results, and the correction coefficient K was found to be 0.7. The value of K reflects the systematic error. The corrected maximum relative standard deviation was 16.8% and the minimum was 1.7%. The sources of systematic errors and related phenomena in the experiment are discussed. The method is simple and easy to use, the technique and the operation are easy to grasp, and no expensive cost is required, and the general laboratory can realize the method. In the absence of large thin-layer analytical instruments and subject to a variety of conditions where this method can be used to a certain extent to solve the task of thin-layer analysis, of practical significance.