双路四通道同时干涉成像光谱仪以视场光阑代替狭缝,无旋转和移动部件,通过消色差分光棱镜和Savart偏光镜将入射光分为四对相干光束,同时在探测器上获取四幅不同偏振信息的目标图像,进而利用傅里叶变换运算并对数据进行处理得到偏振光谱图像。分析系统结构和原理得出不同偏振状态下的干涉强度表达式,四幅干涉图相加获取目标图像的总强度,同一Savart偏光镜的干涉强度相减获得纯干涉条纹,将两纯干涉条纹进行加减运算可降低系统的背景噪声,提高了系统信噪比。在考虑晶体色散关系的基础上分析讨论了光程差随波长、入射角、入射面与晶体主截面夹角以及晶体厚度的变化,在傍轴条件下设计出横向剪切量、成像透镜焦距和晶体厚度的具体参数,实现了高光谱分辨率成像,为新型干涉成像光谱仪的设计与应用提供了一种新方案。 Dual Quadruple Simultaneous Interference Imaging Spectrometer With field stop instead of slit, no rotation and moving parts, the incident light is split into four pairs of coherent beams by achromatic dichroic prism and Savart polariscope, and four different Polarization information of the target image, and then use the Fourier transform calculation and processing of the data to obtain a polarized spectrum image. Analyze the structure and principle of the system to obtain the expression of interference intensity under different polarization states. The total intensities of the target images are obtained by adding four interferograms and subtracting the interference intensity of the same Savart polarizer to obtain pure interference fringes. The two pure interference fringes are added Subtraction can reduce the system background noise and improve the system SNR. Based on the analysis of the relationship between the dispersion of the crystal and the variation of the optical path difference with the wavelength, the incident angle, the included angle between the incident plane and the main section of the crystal and the crystal thickness, the transverse shear amount, the focal length of the imaging lens and Crystal thickness of the specific parameters, to achieve high spectral resolution imaging, the new interference imaging spectrometer design and application provides a new program.