通常一个光电子能谱图有相当复杂的谱峰结构。明了这些谱峰与样品结构、光子同电子的作用过程,以及光电子同声子、电子、杂质和等离子激元等作用过程的关系是非常重要的。它们是识别谱图,通过谱峰分析样品结构的基础。光电子能谱实验中记录的谱图,是上述诸过程的综合描述,通常包含着光电离过程、俄歇过程、各种激发过程,和光电子输运过程中的各种碰撞,以及荧光发射过程;还有表面重构和吸附的影响。所以区别这些过程所对应的谱峰结构是十分重要的工作。如果要通过谱峰的高度和所包围面积的大小作出某种定量 Usually a photoelectron spectrogram has a rather complex spectral peak structure. It is important to understand the relationship between these peaks and the structure of the sample, the action of photons with electrons, and the interaction of phonon, phonon, electron, impurity and plasmon. They are the basis for identifying the spectrum and analyzing the structure of the sample through spectral peaks. The spectra recorded in the photoelectron spectroscopy experiments are a comprehensive description of the above processes and usually include photoionization processes, Auger processes, various excitation processes, various collisions in the photoelectron transport process, and fluorescence emission processes. There are also surface reconstruction and adsorption effects. Therefore, it is very important work to distinguish the peak structure corresponding to these processes. If you want to pass the height of the peak and the size of the enclosed area to make some quantitative