分析了利用探针层（ｐｒｏｂｅ－ｄｏｐｅｄｌａｙｅｒ）实验方法来测量激发效率在电致发光器件的发光层中分布的机理，并利用这种实验方法测量了激发效率在低压驱动薄膜电致发光器件的发光层中的分布特性和器件的激发特性。实验结果表明在这种低压驱动电致发光器件的发光层中激发效率是不均匀的，其分布与器件被激发的程度有关。分析表明低压驱动电致发光的机理是由于发光层中电场强度的不均匀分布 The mechanism of using the probe-doped layer experimental method to measure the distribution of excitation efficiency in the light-emitting layer of an electroluminescent device is analyzed. The excitation efficiency of the low-voltage driven thin film electroluminescent device is measured by this experimental method. Layer distribution and device excitation characteristics. The experimental results show that the excitation efficiency is not uniform in the light-emitting layer of such a low-voltage driving electroluminescent device, and its distribution is related to the degree to which the device is excited. The analysis shows that the mechanism of low-voltage driven electroluminescence is due to the uneven distribution of electric field intensity in the light-emitting layer