论文部分内容阅读
考虑到温度和工艺参数浮动的影响,对休眠双阈值footed多米诺电路的漏电流特性进行了系统的量化研究和比较,得到了不同温度下的最佳休眠状态.基于65和45nmBSIM4模型的HSPICE仿真表明:与业已提出的CHIL(时钟为高,输入均为低电平)状态和CHIH(时钟和输入均为高电平)状态相比,本文提出的CLIL(时钟和输入均为低电平)状态更有利于减小低温下电路的漏电流和高温下的多扇入电路的漏电流.而且,分析了工艺参数的浮动对双阈值footed多米诺电路的漏电流特性的影响,并给出了温度和工艺参数浮动下,双阈值footed多米诺电路漏电流最小的休眠状态.
Taking into account the influence of the temperature and the floating of the process parameters, the leakage current characteristics of the sleep double threshold thresholded domino circuit are systematically studied and compared, and the optimal sleep state is obtained at different temperatures. The HSPICE simulation based on the 65 and 45nm BSIM4 models shows that : Compared with the proposed CHIL (clock is high, input is low) state and CHIH (clock and input are both high) state, the proposed CLIL (clock and input are low) state And more conducive to reduce the leakage current at low temperature circuit and multi-fan circuit leakage current under high temperature.Furthermore, the influence of process parameters on the leakage current characteristics of double threshold footed domino circuit is analyzed, and the relationship between temperature and Under the float of the process parameters, the double threshold footed domino circuit has the least sleep state of leakage current.