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“1996国际测试会议”(International Test Conference 1996,简称ITC’96)于1996年10月20日至25日在美国华盛顿(Washington,D.C.召开)。ITC是由IEEE Computer Society Test Technology Technical Committee和IEEE Philadelphia Section主办的,是国际上有关集成电路测试、板测试和系统测试领域学术水平最高、规模最大、影响最广的国际学术会议。’96 ITC是第27届国际测试会议,其主题是“Test and Design Validity”,集中探讨设计与测试的继续集成问题。大会共交流正式论文约107篇。会议期间还由工业界举办了设计工具与测试设备的展示会。参加大会的总人数达3180人之多,参加拓导报告的人数为941人,参加展览会的人数约1200人。
The International Test Conference 1996 (ITC’96) was held October 20-25, 1996 in Washington, D.C., USA. Hosted by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section, ITC is the international academic conference with the highest academic level, the largest scale and the most extensive influence in the field of IC testing, board testing and system testing in the world. ’96 ITC is the 27th International Test Conference with the theme of “Test and Design Validity,” focusing on the continued integration of design and testing. The conference a total of about 107 formal papers. During the meeting also held by the industrial design tools and test equipment exhibition. The total number of participants to the conference reached as many as 3,180, 941 people participated in the extension guidance and 1,200 persons attended the exhibition.