Electron-induced Hf-, W-L-shell partial, total production cross sections, mean ionization cross sections and HfLa-shell ionization cross sections (at two energies) have been measured as functions of electron energies (from near threshold to 36keV). The influence of electrons reflected from the backing of the thin targets on measured results was corrected using a model to relate to the electron transport process. The mean paths of electron multi-scattered in the target itself (including forward and backward scattering) were calculated by means of Monte Carlo program (EGS4)and they were used to correct measured results. A comparison with both theoretical predictions was given.