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在X—射线荧光定量分析中,由于基体效应的影响,被分析元素的谱线强度在大多数情况下与其在样品中的含量不呈线性关系。因此,X射线分析的主要工作是如何消除、减少或校正基体效应,从而得到谱线强度与元素含量之间的函数关系。为了消除或校正基体效应,通常离不开标准样品。然而要得到组分与被分析样品相同,待测元素含量成一定梯度的标样是有一定困难的。特别是在科研工作中,样品是多变的,更增加了配制标样的困难。我们采用了一种新的不用标准样品,不要标准曲线的薄膜法非常规样品的X—射线荧光元素定量分析方法。该法简单、快速、适应性强。测量元素范围广、含量范围宽、相对标准偏差5％左右。
In X-ray fluorescence quantitative analysis, the spectral line intensity of the element under analysis is not linear with the content of the element in the sample due to the effect of matrix effect. Therefore, the main work of X-ray analysis is how to eliminate, reduce or correct the matrix effect, and get the relationship between spectral line intensity and element content. In order to eliminate or correct the matrix effect, usually can not do without the standard sample. However, to obtain the same composition as the sample being analyzed, it is somewhat difficult to obtain a standard gradient of the elemental content. Especially in scientific research, the sample is changing, more difficult to prepare standard samples. We have adopted a new method for the quantitative analysis of X-ray fluorescence in unconventional thin-film samples using no standard curve or standard curve. The method is simple, fast and adaptable. A wide range of measurement elements, a wide range of content, the relative standard deviation of about 5%.