针对航天器电子产品的寿命预示问题,文章指出对航天器电子产品开展加速寿命试验(ALT)研究,首先要利用故障模式、机理及影响分析(FMMEA),确定产品的主要失效机理和敏感应力;然后利用理论分析或可靠性强化试验确定产品的工作极限;最后设计出完整的试验方案。针对航天器固态功率放大器进行试验,验证了加速寿命试验在航天器电子产品中的适用性。 Aiming at the life prediction of spacecraft electronic products, the article points out that to carry out Accelerated Life Test (ALT) research on spacecraft electronic products, the failure mechanism, mechanism and influence analysis (FMMEA) should be firstly used to determine the main failure mechanism and sensitive stress of the products. Then use the theoretical analysis or reliability enhancement test to determine the work of the product limits; Finally, the design of a complete test program. Experiments on spacecraft solid-state power amplifiers verify the applicability of accelerated life tests in spacecraft electronics.