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在广阔的能区内（从MeV到GeV）系统地研究了荷能离子轰击固态材料形成孤立损伤的形态及其形成机理。分别利用具有原子分辨能力的扫描隧道显微镜／扫描力显微镜观测了离子轰击导电和绝缘材料产生孤立损伤（或离子潜径迹）的形态、大小。通过运用核能损和电子能损的理论对实验结果的分析，研究了离子轰击固态材料形成各种损伤的过程与机理。
In a broad energy range (from MeV to GeV), we systematically studied the morphology and formation mechanism of isolated damage induced by energetic ion bombardment of solid materials. The morphologies and sizes of isolated damage (or ionized track) produced by ion bombardment of conductive and insulating materials were observed respectively by means of scanning tunneling microscope / scanning force microscope with atomic resolution. By using the theory of nuclear energy loss and electron energy loss to analyze the experimental results, the process and mechanism of various kinds of damage caused by ion bombardment of solid materials were studied.