论文部分内容阅读
建立了一套测量样品电压涨落噪声的频谱分析系统，用此系统观察到超导ＹＥａ２Ｃｕ３Ｏ７取向膜在正常态下反常大的１／ｆ噪声，并发现不同结构形貌的样品噪声水平有明显差异．
A spectrum analysis system was set up to measure the voltage fluctuation noise of samples. The 1 / f noise of superconducting YEa2Cu3O7 films was observed under normal conditions. The noise levels of samples with different structures were also significantly different .