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在高灵敏度的红外光学系统中,来自系统内部的热辐射是影响系统探测性能的重要因素之一。污染颗粒物通常是杂散辐射的主要来源,除了光学元件的表面污染,探测器内部也会存在污染颗粒物。文中主要研究探测器内部颗粒物对焦平面光场分布产生的影响。根据红外辐射及散射原理建立了相应的理论模型,对探测器内部不同温度、不同位置的颗粒物在焦平面上形成的光场分布进行了仿真计算和对比分析,并进行了实验验证。结果表明,探测器内部如有颗粒杂质,在一定的使用环境下,可在探测器焦面上产生黑斑、白斑、黑点白斑等异常现象,而这些异常光场分布会对场景中的红外目标物产生干扰,造成误判,从而影响对目标的准确识别。因此应采用措施以保证探测器内部的洁净度,防止颗粒物的产生。
In high sensitivity infrared optical systems, heat radiation from within the system is one of the important factors that affect the detection performance of the system. Particulate matter is usually the main source of stray radiation. In addition to the contamination of the surface of the optical element, there are also contaminants in the interior of the detector. In this paper, we mainly study the influence of the particles inside the detector on the focal plane distribution. According to the theory of infrared radiation and scattering, a theoretical model is established to simulate and compare the light field distributions of the particles on the focal plane with different temperature and different positions inside the detector. The experimental verification is also given. The results show that if there are particles inside the detector, under the certain usage environment, abnormal phenomena such as black spot, white spot and black spots and white spots may occur on the focal plane of the detector, and these abnormal light field distribution will affect the infra-red Target interference, resulting in miscarriage of justice, thus affecting the accuracy of the target identification. Therefore measures should be taken to ensure the detector’s internal cleanliness to prevent the generation of particulate matter.