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摘自《金属》,1988年4月,临时增刊号 如果将探针和导电性试样的表面隔开几微米～几十微米,在两者之间加上电压,则有隧道电流通过。这种隧道电流随试祥和探针间的距离呈指数函数变化。利用这种电流的变化研究试样表面形貌的仪器就是扫描隧道显微镜(STM)。STM的特点是有原子量级的分辨率,可在真空中,大气中或水中直接观察试样表面原子排列的情况。最近还进行了将STM和隧道分光法结合起来,构成扫描型隧道分析显微镜(ASTM)和原子间力显微镜(AFM)的研究。
Excerpt from “Metal”, April 1988, Provisional Supplement No. If the surface of the probe and the conductive specimen are separated by a few microns to several tens of microns, a voltage is applied between the tunneling current and the tunneling current. This tunneling current varies exponentially with the distance between the probe and the probe. The use of this current change to study the surface morphology of the sample is a scanning tunneling microscope (STM). STM is characterized by atomic resolution, can be observed in the vacuum, the atmosphere or water directly on the sample surface atomic arrangement. Recently, STM and tunnel spectroscopy have also been combined to form a scanning tunneling analysis microscope (ASTM) and atomic force microscope (AFM) research.