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测试的目的首先是要求准确地反映器件的性能,提供电路设计使用.其次是通过器件的外部参数的测量为晶体管的内部参数提供根据,有利于改进半导体器件的制造工艺的结构.
The purpose of the test is firstly to accurately reflect the performance of the device and to provide the circuit design to use.Secondly, the measurement of the external parameters of the device provides the basis for the internal parameters of the transistor and improves the structure of the manufacturing process of the semiconductor device.