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利用智能 L CR测试仪、圆形平板电极系统和 PC计算机及自主开发的水果电特性无损检测软件 ,用非接触式无损检测方法在线测定了不同内部品质的苹果的电特性的差异。结果表明 ,在 5～ 10 0 k Hz的频率范围内 ,有腐烂或损伤的苹果的阻抗比完好的要小 ,但测试结果受频率漂移影响较大 ;在 33～ 10 0 k Hz频率范围内 ,有腐烂或损伤的苹果的相对介电常数比完好的要大 ,测试频率的变化对相对介电常数基本无影响 ;损耗因数的变化则无一定的规律性。因此 ,用相对介电常数来进行水果内部品质的判别是可行的。
Using the intelligent L CR tester, the circular plate electrode system and the PC computer and the self-developed fruit electrical non-destructive testing software, the differences of the electrical properties of different internal quality apple were determined by the non-contact non-destructive testing method. The results show that in the frequency range of 5 ~ 10 0 k Hz, the impedance of apple with decay or damage is smaller than that of the intact apple, but the test result is greatly affected by the frequency drift; in the frequency range of 33 ~ 100 k Hz, The relative dielectric constant of decayed or damaged apples is larger than intact, and the change of test frequency has no effect on the relative dielectric constant. The loss factor has no regularity. Therefore, it is feasible to judge the internal quality of fruit by relative dielectric constant.