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本文认为在红外光学系统评价中,刀口(或狭缝)扫描法是解决红外OTF测量的最适当的方法。对于线性光学系统,可用卷积运算来描写物分布O和象分布M之间的关系。若目标是一个线光源,M是O和线扩散函数L的卷积,F(M)就等于F(O)和F(L)的乘积。F(L)是描写光学系统象质的光学传递函数,用OTF(f)表示。因此,扫描法测OTF就可归结为用一狭缝目标经被测系统成象,在象面上得到的亮度分布就是目标的线扩展函数。用狭缝或刀口沿垂直于线源方向扫描,即可测得这一强度分布,经傅氏变换就得到OTF。考虑到实际系统和其它象差,及实施的可能性,我们暂以最高空间频率100lp/mm、重复率5%和被测系统焦长小于500mm作为设计的出发点。所用测量装置由线光源、扫描机
This paper considers that in the evaluation of infrared optical system, the knife edge (or slit) scanning method is the most suitable method to solve the infrared OTF measurement. For a linear optical system, the relationship between the object distribution O and the image distribution M can be described by a convolution operation. If the target is a line light source, M is the convolution of O with the linear diffusion function L, F (M) equals the product of F (O) and F (L). F (L) is the optical transfer function describing the optical quality of the optical system, denoted by OTF (f). Therefore, the scanning method OTF can be attributed to a slit target imaging system under test, the brightness distribution obtained in the image plane is the target line expansion function. With a slit or blade along the direction perpendicular to the line source scanning, you can measure the intensity distribution, obtained by Fourier transform OTF. Taking into account the actual system and other aberrations, and the possibility of implementation, we temporarily to the maximum spatial frequency 100lp / mm, 5% repetition rate and the measured focal length is less than 500mm as the starting point for the design. The measuring device used by the line light source, scanner