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应用北京师范大学2×1.7MV串列静电加速器提供的质子束,采用相对测量方法测量了0.70～2.48MeV宽能区质子在轻核F和Mg上160°(实验室坐标系)背散射截面。测量得到F、Mg各自对应能区的质子共振背散射截面数据,为含F、Mg轻元素的新型薄膜材料的高灵敏分析提供了实验数据。
A proton beam from a 2 × 1.7MV tandem electron accelerator at Beijing Normal University was used to measure the backscatter cross section of the proton at 0.70 ~ 2.48 MeV in the 160 ° (lab coordinate system) of the F and Mg wide band protons. The proton resonance backscattering cross section data of the corresponding energy regions of F and Mg were measured and the experimental data were provided for the highly sensitive analysis of novel thin film materials containing F and Mg.