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通过对 ２５ＭｅＶ／ｕ４０Ａｒ＋１１５ Ｉｎ反应 θｌａｂ＝ １５°的邻近几何条件下的轻带电粒子和出射碎片之间的关联测量，观察到了两体相继衰变机制的存在．其中，轻带电粒子和碎片的关联角度谱在小角度成峰，最可几角度约２°左右；轻带电粒子能谱峰位，随关联对的质量增加而逐渐增高；质量较轻的原始产物容易受到激发，通过发射轻带电粒子而衰变成轻中等质量碎片．在两体相继衰变中，原始激发产物发射重质量的轻带电粒子的产额或几率要大于质量轻的轻带电粒子，具体测量发现，与轻带电粒子１１，２１Ｈ，３１Ｈ和ａ粒子关联的碎片（Ｚｆ＝４—１４）总的产额比为１：１．３：１．７８：７．５７．
By the correlation measurement between the lightly charged particles and the exiting debris under the neighboring geometrical conditions of 25MeV / u40Ar + 115In reaction θlab = 15 °, the existence of two-body sequential decay mechanism was observed. Among them, the correlation angle spectrum of light charged particles and debris peaked at a small angle, the most probable angle was about 2 °; the peak position of light charged particles increased gradually with the increase of the mass of associated pairs; the lighter mass of the original product Easily excited by the launch of light charged particles and decay into light and medium-quality debris. During the successive decay of the two bodies, the yield or probability of the light-excited particles of the original excitation product emitting heavy masses is greater than that of the light-weighted particles of the light weight. The specific measurements show that the fragments associated with the light-charged particles 11, 21H, 31H and a particles (Zf = 4-14) The total yield ratio is 1: 1.3: 1.78: 7.57.