本文介绍一种校正半导体存儲器软硬二位错的方法,即对包含一个软错误和一个硬错误的二位错故障实现校正。通常的SEC/DED~*方法只能对一位错校正对二位错检测,若要校正二位错,则必须增加硬件冗余度,从而使成本增加。本文介绍的方法是利用SEC/DED校正方法与二次求反法相结合,使SEC/DED的校正能力从只能校一位错扩展到能校正二位错。从而提高了半导体存储器的可靠性。 This article describes a method of correcting hard and soft binary dislocations in semiconductor memories by correcting for two-bit faults that contain a soft error and a hard error. The usual SEC / DED ~ * method can only detect one bit of error for two bit errors. To correct two bit errors, hardware redundancy must be increased to increase the cost. This article describes the method is the use of SEC / DED correction method combined with quadratic inversion method, so that SEC / DED correction capability can only be from one school to a single fault can be corrected to the second dislocation. Thus improving the reliability of the semiconductor memory.