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扫频技术的迅速发展,对微波技术水平的提高起着极为重要的作用。本文讨论了扫频测量系统中的一些关键元件,详细论述了以扫频为基础的反射系数测量的进展。利用讯号流图分析了反射计和开槽线的精确度。比较结果表明,在典型实验室中,扫频测量具有的精确度与缓慢而繁琐的固定频率测量的精确度相当。研制一种能够以复数散射矩障全面表征高频网络特性的仪器,这是一项重大进展。文中对好几种扫频测量微波参量的幅值和相位的新方法作了说明,引入了经改进的S参量设计程序。
The rapid development of sweep technology plays an extremely important role in the improvement of microwave technology. This article discusses some of the key components of a swept-frequency measurement system and details the progress of the reflection coefficient measurement based on the sweep frequency. The signal flow diagram was used to analyze the accuracy of reflectometer and slotted line. The results of the comparison show that in typical laboratories the accuracy of sweep measurements is comparable to that of slow and tedious fixed-frequency measurements. It is a significant development to develop an instrument that can fully characterize the characteristics of HF networks with multiple scattering moments. In this paper, several new methods of sweeping the amplitude and phase of microwave parameters are described, and the improved S-parameter design procedure is introduced.