论文部分内容阅读
,Structural, electrical and optical characterization of InGaN layers grown by MOVPE
【机 构】
：
Physics Department,University of Ahi Evran,Asikpasa Kampusu,40040,Kirsehir,Turkey“,”Mineral Analysis
【出 处】
：
中国物理B（英文版）
【发表日期】
：
2009年9期
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