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不同于扫描隧道显微镜(scanning tunneling microscope,STM),原子力显微镜(atomic force microscope,AFM)主要通过探测针尖和样品间的相互作用力获得样品表面信息,不需要导电的样品,可以研究比STM更为广泛的样品体系,自发明以来迅速成为基础科学和应用研究领域中一种强有力的工具.近几年发展起来的基于qPlus技术的非接触式原子力显微镜(qPlus-noncontact AFM,qPlus-NC-AFM),通过关键部件原子力传感器的改进,进一步拓展了原子力显微镜的探测能力,从而在许多研究方向上取得了重要突破.本文介绍了qPlus-AFM的基本工作原理及其在基础科学研究领域中的最新研究进展,并对其进一步的发展进行了展望.
Unlike the scanning tunneling microscope (STM), the atomic force microscope (AFM) acquires the surface information of the sample primarily by detecting the interaction between the tip and the sample, and does not require conductive samples. Extensive sample system has rapidly become a powerful tool in the field of basic science and applied research since it was invented.In recent years, qPlus-based non-contact AFM (qPlus-NC-AFM) ), Through the improvement of atomic force sensor of key components, further expands the detection ability of AFM, and thus has made important breakthroughs in many research directions.This paper introduces the basic working principle of qPlus-AFM and its latest in the field of basic scientific research Research progress, and prospects for its further development.