本文分析了三维效应对平面光弹技术测量精度的影响,并以阿朋(Aben)的偏振光在光弹性体中传播的三维理论为基础,提出了平面光弹的“准平面”特征以及平面光弹的“准平面”点测法。此方法消除了三维效应所导致的测量误差,提高了测量精度。实验证明新方法是可行的。 In this paper, the effect of three-dimensional effect on the measurement accuracy of planar photoelastic technology is analyzed. Based on the three-dimensional theory of Aben polarized light propagating in photoelastic body, the “quasi-plane” Photoelastic “quasi-plane” point method. This method eliminates the measurement error caused by the three-dimensional effect and improves the measurement accuracy. Experiments show that the new method is feasible.