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我们通过SERS的方法研究了单个金微米片表面不同区域的电磁场增强。首次对单个金属粒子采用拉曼区域成像的方法为电磁场增强提供了直接的实验证据。用结晶紫作为探针分子,通过对金微米六边形及截断的金微米三角形的SERS研究,直接证明金属粒子的边和角比面的电磁场增强更强。排除分子吸附、杂质干扰、晶体缺陷、表面活性剂等因素的影响,最后得出金微米片上电磁场增强的强弱顺序是角#边#面。
We investigated the electromagnetic field enhancement in different areas on the surface of a single gold micrometer by SERS method. For the first time, a single metal particle Raman region imaging method for the electromagnetic field enhancement provides direct experimental evidence. Using crystal violet as the probe molecule, the SERS study of the gold micrometer hexagons and the truncated gold micrometer triangles directly proves that the electromagnetic field enhancement of the metal particles is better than that of the surface. Exclusion of molecular adsorption, impurity interference, crystal defects, surfactants and other factors, and finally concluded that gold micro-chip on the strengthening of the electromagnetic field sequence is the angle # edge # surface.