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ＨＬ－１装置放电期间，利用表面收集探针暴露于等离子体边界区，并随后进行综合表面分析研究了第一壁材料结构对等离子体删削层的杂质流通量和杂质分布的影响。
During discharging, the HL-1 device was exposed to the plasma boundary region using a surface-collecting probe and then subjected to comprehensive surface analysis to investigate the effect of the first wall material structure on the impurity flow and impurity distribution in the plasma ablation layer.