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本文对各种检测PAM的方法进行了分析、对比和选择。介绍了“N~(3/2)跳步写恢复法”的特点及该方法在动态检测RAM(2114)芯片中的应用。经在“载波通路特性程控测试仪”和其它装置上实际运行,表明根据此法所编的程序实用、可靠。
This article examines a variety of methods for the analysis of PAM, comparison and selection. This paper introduces the characteristic of “N ~ (3/2) jump step recovery method” and the application of this method in the dynamic detection of RAM (2114) chip. The actual operation of the “Carrier Path Programmable Tester” and other devices shows that the program compiled according to this method is practical and reliable.