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采用质子激发Ｘ射线（ＰＩＸＥ）分析技术，以能量为２．０ＭｅＶ的质子束为激发源，利用单元四极磁透镜对带电粒子束的单向聚束本领，对超导材料样品ＣａＳｒ２Ｂｉ２Ｃｕ２Ｏ８进行了扫描ＰＩＸＥ分析，获得了其中元素Ｘ射线强度的垂向分布数据。在没有质子数数据参数的情况下，针对这种样品组成已知的特殊性，采用了内标迭代定量分析方法，获得了各元素的垂向浓度分布结果。强度和浓度数据均表明，元素Ｃａ主要分布在样品的顶部表层，证明人们关于超导材料合成过程中存在重力效应影响的推断是正确的。
Using proton excitation X-ray (PIXE) analysis technology, the energy of 2.0MeV proton beam as the excitation source, the use of unit quadrupole magnetic lens on the charged particle beam unidirectional bunching ability, superconducting material samples CaSr2Bi2Cu2O8 were scanned PIXE analysis, obtained the vertical distribution of the element X-ray intensity data. In the absence of proton data parameters, aiming at the known particularity of this sample composition, an internal standard iterative quantitative analysis method was used to obtain the vertical concentration distribution of each element. Both intensity and concentration data indicate that the elemental Ca is mainly distributed on the top surface of the sample, proving that it is correct to infer that there is a gravitational effect in the synthesis of the superconducting material.