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持续光电导现象是影响多晶金刚石紫外探测器时间响应性能的一个不利因素,它的存在会大大延长探测器的响应时间.本文在微米晶金刚石薄膜上制备了叉指电极间距分别为20μm和30μm的紫外探测器(分别称为器件A和器件B),讨论了晶界对多晶金刚石紫外探测器时间响应性能的影响.结果表明,器件A和器件B均表现出持续光电导和光电导增益现象,并且器件B比器件A更显著.分析得出,晶界缺陷可能在金刚石带隙中引入一个浅能级并起少数载流子陷阱中心的作用,导致了探测器的持续光电导现象和高增益.相比器件A,器件B电极间具有更多的晶界数量,因此器件B表现出更为显著的持续光电导和更高的光电导增益.
Persistent photoconductivity is an unfavorable factor that affects the time response of polycrystalline diamond UV detector, and its existence greatly prolongs the response time of the detector.In this paper, the interdigital electrodes are prepared on the microcrystalline diamond films with spacing of 20μm and 30μm respectively The effects of grain boundaries on the time response of polycrystalline diamond UV detectors were discussed.The results show that both device A and device B exhibit sustained photoconductivity and photoconductive gain , And Device B is more pronounced than Device A. It was analyzed that grain boundary defects may introduce a shallow energy level in the diamond bandgap and function as a minority carrier trap center leading to persistent photoconductivity of the detector and high Gain. Device B has more number of grain boundaries between device A and device B, so Device B shows more significant sustained photoconductivity and higher photoconductive gain.